ATOMIC FORCE MICROSCOPE ANALYSIS
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| Atomic Force Microscope | ||||
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| Atomic Force Microscope | Tip of AFM | Analytical - AFM | ||
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| AFM of stepped surface of an Al2O3 wafer after O2 annealing | ||||
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| AFM of different SrTiO3 substrates after Ti - termination | |||
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| AFM of an Al2O3 wafer with GaN layer and a deep defect | ||
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| AFM of a GaN single crystal grown out of a GaN layer |
AFM of a GaN crystal grown through a GaN layer |
AFM of a GaN layer with growth defects resulting out of scratches in the Al2O3 substrate |
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| AFM of a GaN layer with a large defect resulting out of resin remains on the substrate |
AFM of a scratch made by handcleaning on a Al2O3 substrate |
AFM of BaTiO3 substrate with lamellas out of phase transition Stress |
